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Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale by Sergei V. Kalinin

Download Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale Sergei V. Kalinin
Language: English
Page: 1002
Format: djvu
ISBN: 0387286675, 9780387286679
Publisher: Springer

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.